Equilibrium Shockley-Read-Hall recombination

For some very ordered material systems where there are not many trap states it is enough to describe SRH trap states using the equation:

$${\frac{{np-n_{0}*p_{0}}}{{\tau_{p} (n+n_{1})+\tau_{n} (p+p_{1})}}}$$ (43)

where R_SRH is the rate of SRH recombination, n, p are the density of free charge carriers n₀, p₀, are the equilibrium density of charge carriers, τ_{n, p} are the SRH life times and n₁ and p₁ are the trapped electron and hole densities when the Fermi-level matches the trap state energy. This can be turned on in the electrical parameter editor.